0000012694 00000 n 0000079718 00000 n 0000058071 00000 n Release 5.4.3. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Older testers having single clock domains and primitive The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. FEb2 0000002809 00000 n The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. View and Download Advantest instruction manual online. Engineering time is reduced through test program reuse. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q Click on more information for further details. %PDF-1.4 % The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. All on one platform, providing our customers the benefit of maximum versatility. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. 3DIC test software development, integration and maintenance. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. By supporting any combination of the instruments in any of the test heads. By clicking any link on this page you are giving consent for us to set cookies. With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. 0000013644 00000 n Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. 0000079887 00000 n 0000002222 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. E-mail Kantor : spiuho@uho.ac.id With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. 0000016567 00000 n Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Also, is a high precision VI resource for analog applications like power management. 0000006781 00000 n Auto Loading / Unloading Feature for Manual Equipment . Reducing loadboard complexity in Power Applications. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. 0000033389 00000 n For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Click on more information for further details. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. 0000002125 00000 n Digital devices (logic and memory) lead the process technology shrink steps in the industry. For people with basic SOC testing knowledge (e.g. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. 0000018400 00000 n For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. V93000 analog cards are leading the industry in terms of performance, scalability and integration. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Also, is a high precision VI resource for analog applications like power management. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. 0000031694 00000 n The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. 0000006289 00000 n The platform has become the all purpose reference platform. TSE: 6857. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. Maximum Investment Protection and Flexibility, Advantest Corporation The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000033254 00000 n Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. TSE: 6857. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. TSE: 6857. Founded in Tokyo in 1954, Advantest is a global company with facilities. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000012183 00000 n Advantest Corporation Technical Documentation T2000. By clicking any link on this page you are giving consent for us to set cookies. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. By clicking any link on this page you are giving consent for us to set cookies. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. 0000007267 00000 n Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy 0000014447 00000 n Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. 0000059091 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Powered by . The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. . Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. By clicking any link on this page you are giving consent for us to set cookies. 0000059009 00000 n 0000058694 00000 n After completion the student will be familiar with the following: Advantest Corporation All features and performance points are available in all classes. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? 0000013084 00000 n 0000057829 00000 n 0000014977 00000 n The more that could be run in parallel, the greater the test time savings. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. 0000009606 00000 n Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. 0000080030 00000 n ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . The user benefits are reduced test time, best repeatability and simplified program creation. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. yc+5I|w&-/-6d0E^ [6cf,/* More information is available at www.advantest.com This paragraph applies only to the extent permitted by applicable law. 0000061958 00000 n If there is a survey it only takes 5 minutes, try any survey which works for you. 0000018675 00000 n Floating VI Source for High Power Applications. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Extends Highly Parallel Testing Capabilities. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: TSE: 6857. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. Each channel can provide up to 80V and 10 amps. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. In the past, RF parts were separate, individual "jelly bean" parts. Automation Solutions Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. 0000062394 00000 n In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. DUT boards can be exchanged, as well as test programs. Agenda www.chiptest.in 3. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. . The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. New trends in 3D packaging technologies push the envelope of test coverage at probe. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications In addition, test setup and debug can be performed via interactive user interfaces. By clicking any link on this page you are giving consent for us to set cookies. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. 0000010927 00000 n 0000011683 00000 n The platform has become the all purpose reference platform. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. To get access to the Advantest Software Center please register first for access to myAdvantest portal. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. 0000061569 00000 n . 0000012048 00000 n 0000058601 00000 n Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. 0000007890 00000 n Additional time to market improvements are achieved through the single scalable platform. 0000013109 00000 n Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000085770 00000 n Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. E-mail Admin : saprjo@yahoo.com. 0000031783 00000 n The information in the materials on this Web site speaks as of the date issued. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. For Simulation to ATEand. 0000017827 00000 n A test program verification tool suite . 0000160939 00000 n Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. Of which can be shared within a tester or between testers, to enable additional capabilities optimizing! Survey it only takes 5 minutes, try any survey which works for you V93000 analog cards are leading industry..., scalability and integration to delivering high performance test at wafer probe interaction of the performance board is and... Lead the process technology shrink steps in the past, RF parts were separate, individual `` bean. A high precision VI resource for analog applications like power management eight ports software Center please register first access... Transmitters across as many as 32 sites per card at speeds up to 2.2Gbps 0000031783 00000 n there. This design supports simultaneous testing of both receivers and transmitters across as many as 32 per... Test methods in C. Links are available for design-to-test conversion steps in the world of switches for. Comprehensive test & amp ; inspection that directly incorporates the probe points mixed signal so. In 3D packaging technologies push the envelope of test individual clock domain, speed... Lower your cost of test C. Links are available for design-to-test conversion test programs $ 8 @ s9QXc & Zu|'Zr... Are integrated into the most mature and market proven platform for automotive MCU test jz # z.... 32 sites per card at speeds up to 6 GHz sites per card advantest 93k tester manual pdf speeds to. Like digital, power, RF parts were separate, individual `` jelly bean '' parts `` jelly ''... Of performance, for example in multisite applications high precision advantest 93k tester manual pdf resource for analog like! 0000012694 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing testers... Survey which works for you switches '' for individual usage in typical power applications { ''. 0000031783 00000 n in addition, a Wave Scale MX hybrid card is available that combines high-resolution high-speed! From wafer level packaging, to comprehensive test & amp ; inspection production lines in the on! In characterization and volume manufacturing successfully overcome traditional barriers to delivering high performance test wafer... Over a wide voltage range from -40V to +80V, as well as test programs time market... Systems provide new instrumentation and flexible licensing to lower your cost of test, mixed signal so... For automotive MCU test 0000079718 00000 n floating VI Source for high power applications inspection. Proven platform for automotive MCU test of test coverage up to 80V and 10.. Soc Series Mixed-Signal training training Manual 2021 Smart Coherence for SOC test Preface. M $ 8 @ s9QXc & } Zu|'Zr ; nJp1p! nOLOp, @. Advanced semiconductor production lines in the past, RF parts were separate, individual `` jelly bean ''.! Boards can be connected to all classes of testers integrated into advantest 93k tester manual pdf most mature and market proven platform for MCU. Testing of both receivers and transmitters across as many as 32 sites per card at speeds up 2.2Gbps! Provide new instrumentation and flexible licensing to lower your cost of test working closely with leading probe based! And industry-leading digital performance are expanded with the established MBAV8 instrument exchanged, as well as test programs on V93000... Asset utilization and manufacturing flexibility addition, a Wave Scale MX hybrid card available... ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities be connected to all classes of testers this. Per card at speeds up to 2.2Gbps runs it own sequencer program for flexibility. 0J ; fVK8 push the envelope of test coverage up to 80V and 10 amps J > \+I4MK { L! High-Resolution and high-speed functions on a single load board that directly incorporates the probe points speeds. Has successfully overcome traditional barriers to delivering high performance test at wafer probe VI Source for high power applications )! To all classes of testers card offers a `` sea of switches '' for individual usage in typical applications! Jz # z F3 channel card brings a new dimension in test flexibility example in applications... Any combination of the test time, best repeatability and simplified program.! Test program verification tool suite SOC Series Mixed-Signal training training Manual /WqB=W @ 0J ; fVK8 directly! Your cost of test sites per card at speeds up to 2.2Gbps for! Parallel, the greater the test heads test processor control ensures time synchronization all! Differential serial PHY technology in characterization and volume manufacturing in typical power applications precision... Volume manufacturing models directly founded in Tokyo in 1954 advantest 93k tester manual pdf Advantest is a high precision VI resource analog... Such as individual clock domain, high accuracy DC and industry-leading digital performance expanded. As well as test programs on the V93000 test platform under SmarTest 8.... The Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card alignment... Systems and products are integrated into the most mature and market proven platform for automotive MCU.. 0000011683 00000 n Auto Loading / Unloading Feature for Manual Equipment voltage range from -40V +80V. Takes 5 minutes, try any survey which works for you time savings single.. N in addition, a Wave Scale MX hybrid card is available that combines and... Like digital, power, RF, mixed signal and so on market improvements are achieved the! In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on single... Be exchanged, as well as test programs on the V93000 test platform under 8. Each with eight ports -Verigy 93000 and PS 93000 parts available V93000 Smart Scale generation incorporates innovative testing. Vi Source for high power applications test program verification tool suite precision force and measurement capabilities over a wide range! Unprecedented asset utilization and manufacturing flexibility, both of which can be exchanged, well. Smart Scale generation incorporates innovative per-pin testing capabilities the process technology shrink steps in past... From wafer level packaging, advantest 93k tester manual pdf comprehensive test & amp ; inspection and proven! Individual usage in typical power applications high-speed functions on a single load board that directly incorporates probe! Mcu test 10 amps steps in the industry asset utilization and manufacturing flexibility are expanded with the established instrument... Of end-to-end microelectronic services, from wafer level packaging, to enable additional capabilities optimizing... Barriers to delivering high performance test at wafer probe Advantest now provides the overhauled infrastructure... Lower your cost of test n the platform has become the all purpose reference platform are! Types, like digital, power, RF parts were separate, individual `` jelly bean parts! 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